DocumentCode :
3072161
Title :
Programmable MBIST Merging FSM and Microcode Techniques Using Macro Commands
Author :
Noor, NurQamarina Mohd ; Saparon, Azilah ; Yusof, Yusrina
Author_Institution :
Centre of Electron. Eng. Studies, Univ. Teknol. MARA, Shah Alam, Malaysia
fYear :
2010
fDate :
6-8 Oct. 2010
Firstpage :
115
Lastpage :
121
Abstract :
FSM-based and microcode-based controllers are two widely known techniques used for memory built-in self test (MBIST). FSM-based controller is commonly the hardwired BIST whilst microcode-based controller is a programmable memory BIST (P-MBIST) controller. The P-MBIST is popular because of their flexibility of programming new test algorithms. Recently, the FSM-based memory BIST has evolved from hardwired BIST to P-MBIST by applying macro-commands on-line. In this macro-command P-MBIST, the test algorithms and the MARCH elements are represented by macro codes. However, the read/write operations, the applied test data and the addressing orders in an element are still controlled by the FSM. In this paper, the read/write operations and the applied test data are micro-coded before being controlled by the FSM in order to minimize the area overhead for the P-MBIST. To reach the objective, the previous P-MBISTs using macro-commands are studied and reconstructed. The components of the proposed P-MBIST controller are designed and explained. These controllers are written using Verilog HDL and implemented in ALTERA Cyclone II FPGA. Analysis and comparison of architecture between these three P-MBIST controllers are performed. The simulation and synthesis results of all three architectures are presented. The performance of each controller is compared in term of area overhead and speed. The synthesis result proves the area of the proposed controller is improved by 24 to 31 percent compared to the previous P-MBIST controllers.
Keywords :
built-in self test; field programmable gate arrays; finite state machines; hardware description languages; ALTERA Cyclone II FPGA; FSM-based controller; Verilog HDL; hardwired BIST; macro commands; memory built-in self test; microcode techniques; microcode-based controller; on-line macrocommands; programmable MBIST merging FSM; programmable memory BIST controller; read-write operations; test algorithms; Algorithm design and analysis; Built-in self-test; Clustering algorithms; Decoding; Encoding; Memory management; Radiation detectors; FSM-based; MBIST; area; macro-commands; microcode-based; programmable;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location :
Kyoto
ISSN :
1550-5774
Print_ISBN :
978-1-4244-8447-8
Type :
conf
DOI :
10.1109/DFT.2010.20
Filename :
5634870
Link To Document :
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