• DocumentCode
    3072344
  • Title

    Duals in Spectral Fault Localization

  • Author

    Naish, Lee ; Hua Jie Lee

  • Author_Institution
    Dept. of Comput. & Inf. Syst., Univ. of Melbourne, Melbourne, VIC, Australia
  • fYear
    2013
  • fDate
    4-7 June 2013
  • Firstpage
    51
  • Lastpage
    59
  • Abstract
    Numerous set similarity metrics have been used for ranking "suspiciousness" of code in spectral fault localization, which uses execution profiles of passed and failed test cases to help locate bugs. Research in data mining has identified several forms of possibly desirable symmetry in similarity metrics. Here we define several forms of "duals" of metrics, based on these forms of symmetries. Use of these duals, plus some other slight modifications, leads to several new similarity metrics. We show that versions of several previously proposed metrics are optimal, or nearly optimal, for locating single bugs. We also show that a form of duality exists between locating single bugs and locating "deterministic" bugs (execution of which always results in test case failure). Duals of the various single bug optimal metrics are optimal for locating such bugs. This more theoretical work leads to a conjecture about how different metrics could be chosen for different stages of software development.
  • Keywords
    program debugging; software metrics; deterministic bugs; duality form; execution profiles; metrics duals; set similarity metrics; similarity metrics; single bug optimal metrics; software development; spectral fault localization; Australia; Benchmark testing; Computer bugs; Data mining; Measurement; Software; Vectors; debugging; fault localization; program spectra; set similarity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Conference (ASWEC), 2013 22nd Australian
  • Conference_Location
    Melbourne, VIC
  • ISSN
    1530-0803
  • Type

    conf

  • DOI
    10.1109/ASWEC.2013.16
  • Filename
    6601292