DocumentCode
3072344
Title
Duals in Spectral Fault Localization
Author
Naish, Lee ; Hua Jie Lee
Author_Institution
Dept. of Comput. & Inf. Syst., Univ. of Melbourne, Melbourne, VIC, Australia
fYear
2013
fDate
4-7 June 2013
Firstpage
51
Lastpage
59
Abstract
Numerous set similarity metrics have been used for ranking "suspiciousness" of code in spectral fault localization, which uses execution profiles of passed and failed test cases to help locate bugs. Research in data mining has identified several forms of possibly desirable symmetry in similarity metrics. Here we define several forms of "duals" of metrics, based on these forms of symmetries. Use of these duals, plus some other slight modifications, leads to several new similarity metrics. We show that versions of several previously proposed metrics are optimal, or nearly optimal, for locating single bugs. We also show that a form of duality exists between locating single bugs and locating "deterministic" bugs (execution of which always results in test case failure). Duals of the various single bug optimal metrics are optimal for locating such bugs. This more theoretical work leads to a conjecture about how different metrics could be chosen for different stages of software development.
Keywords
program debugging; software metrics; deterministic bugs; duality form; execution profiles; metrics duals; set similarity metrics; similarity metrics; single bug optimal metrics; software development; spectral fault localization; Australia; Benchmark testing; Computer bugs; Data mining; Measurement; Software; Vectors; debugging; fault localization; program spectra; set similarity;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering Conference (ASWEC), 2013 22nd Australian
Conference_Location
Melbourne, VIC
ISSN
1530-0803
Type
conf
DOI
10.1109/ASWEC.2013.16
Filename
6601292
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