• DocumentCode
    3072645
  • Title

    Penalized-likelihood reconstruction for metal artifact reduction in cone-beam CT

  • Author

    Aootaphao, Sorapong ; Pintavirooj, Chuchart ; Sotthivirat, Saowapak

  • Author_Institution
    Department of Electronics, Faculty of Engineering, and Research Center for Communications and Technology (ReCCIT), King Mongkut´´s Institute of Technology Ladkrabang, Thailand
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    2733
  • Lastpage
    2736
  • Abstract
    CT reconstruction from metal-embedded data usually produces streak artifacts that reduce the quality of the reconstructed images. In this paper, we propose a new technique for metal artifact reduction in cone-beam CT based on statistical reconstruction. First, the metal objects are segmented in the reconstructed images and then reprojected to obtain the measurement data of the metal objects using cone-beam reconstruction. The original measurement data in the metal area are corrected through cubic interpolation. y, the corrected measurement data are reconstructed with the penalized likelihood using the modified convex algorithm. The simulation results show that the reconstructed images of the metal object using the proposed metal artifact reduction technique are superior to conventional filtered backprojection reconstruction.
  • Keywords
    Area measurement; Attenuation measurement; Communications technology; Computational modeling; Computed tomography; Detectors; Image reconstruction; Image segmentation; Interpolation; Maximum likelihood estimation; Algorithms; Artifacts; Computer Simulation; Cone-Beam Computed Tomography; Humans; Imaging, Three-Dimensional; Likelihood Functions; Models, Statistical; Motion; Phantoms, Imaging; Radiographic Image Enhancement; Radiographic Image Interpretation, Computer-Assisted; Reproducibility of Results; Respiratory Mechanics; Sensitivity and Specificity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4649767
  • Filename
    4649767