• DocumentCode
    3072676
  • Title

    Predicting Fault-Prone Software Modules with Rank Sum Classification

  • Author

    Cahill, James ; Hogan, James M. ; Thomas, Robert

  • Author_Institution
    Fac. of Sci. & Eng., Queensland Univ. of Technol., Brisbane, QLD, Australia
  • fYear
    2013
  • fDate
    4-7 June 2013
  • Firstpage
    211
  • Lastpage
    219
  • Abstract
    The detection and correction of defects remains among the most time consuming and expensive aspects of software development. Extensive automated testing and code inspections may mitigate their effect, but some code fragments are necessarily more likely to be faulty than others, and automated identification of fault prone modules helps to focus testing and inspections, thus limiting wasted effort and potentially improving detection rates. However, software metrics data is often extremely noisy, with enormous imbalances in the size of the positive and negative classes. In this work, we present a new approach to predictive modelling of fault proneness in software modules, introducing a new feature representation to overcome some of these issues. This rank sum representation offers improved or at worst comparable performance to earlier approaches for standard data sets, and readily allows the user to choose an appropriate trade-off between precision and recall to optimise inspection effort to suit different testing environments. The method is evaluated using the NASA Metrics Data Program (MDP) data sets, and performance is compared with existing studies based on the Support Vector Machine (SVM) and Naïve Bayes (NB) Classifiers, and with our own comprehensive evaluation of these methods.
  • Keywords
    program testing; software fault tolerance; software metrics; MDP data sets; NASA metrics data program; NB classifiers; SVM; automated fault identification; automated testing; code fragments; code inspections; defect correction; defect detection; detection rates; fault prone modules; fault proneness; fault-prone software modules prediction; naïve Bayes classifier; predictive modelling; rank sum classification; rank sum representation; software development; software metrics data; support vector machine; testing environments; Inspection; Measurement; NASA; Niobium; Software; Support vector machines; Testing; fault proneness; machine learning; metrics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Conference (ASWEC), 2013 22nd Australian
  • Conference_Location
    Melbourne, VIC
  • ISSN
    1530-0803
  • Type

    conf

  • DOI
    10.1109/ASWEC.2013.33
  • Filename
    6601309