Title :
Design and test of planar transformer using CMOS technology with BALUN applications
Author :
Chien-Chang Huang ; Wei-Di Tu ; Chia-Kai Chen
Author_Institution :
Dept. of Commun. Eng., Yuan Ze Univ., Chungli, Taiwan
Abstract :
This paper presents design and test of a planar transformer using 0.18 μm CMOS technology with BALUN applications. To enhance the transformer coupling coefficient of the primary/secondary coil, the broadside-coupled structure is adapted while the circuit size is also minimized in chip area of 190 μm × 190 μm. The measured results based on the differential-/common-mode thru-reflect-line (TRL) calibration are shown and the associated transformer parameters including inductances and coupling coefficient are extracted. The additional BALUN application is performed as well in the frequency range of 1.6 GHz - 12 GHz.
Keywords :
CMOS integrated circuits; UHF integrated circuits; baluns; calibration; field effect MMIC; transformer testing; CMOS technology; TRL calibration; associated transformer parameters; balun applications; broadside-coupled structure; differential-common-mode thru-reflect-line calibration; frequency 1.6 GHz to 12 GHz; planar transformer testing; primary-secondary coil; size 0.18 mum; transformer coupling coefficient; CMOS integrated circuits; Calibration; Coils; Couplings; Impedance matching; Ports (Computers); Scattering parameters;
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-1635-4
Electronic_ISBN :
2150-5934
DOI :
10.1109/IMPACT.2012.6420246