• DocumentCode
    3073302
  • Title

    Design and test of planar transformer using CMOS technology with BALUN applications

  • Author

    Chien-Chang Huang ; Wei-Di Tu ; Chia-Kai Chen

  • Author_Institution
    Dept. of Commun. Eng., Yuan Ze Univ., Chungli, Taiwan
  • fYear
    2012
  • fDate
    24-26 Oct. 2012
  • Firstpage
    220
  • Lastpage
    223
  • Abstract
    This paper presents design and test of a planar transformer using 0.18 μm CMOS technology with BALUN applications. To enhance the transformer coupling coefficient of the primary/secondary coil, the broadside-coupled structure is adapted while the circuit size is also minimized in chip area of 190 μm × 190 μm. The measured results based on the differential-/common-mode thru-reflect-line (TRL) calibration are shown and the associated transformer parameters including inductances and coupling coefficient are extracted. The additional BALUN application is performed as well in the frequency range of 1.6 GHz - 12 GHz.
  • Keywords
    CMOS integrated circuits; UHF integrated circuits; baluns; calibration; field effect MMIC; transformer testing; CMOS technology; TRL calibration; associated transformer parameters; balun applications; broadside-coupled structure; differential-common-mode thru-reflect-line calibration; frequency 1.6 GHz to 12 GHz; planar transformer testing; primary-secondary coil; size 0.18 mum; transformer coupling coefficient; CMOS integrated circuits; Calibration; Coils; Couplings; Impedance matching; Ports (Computers); Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4673-1635-4
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2012.6420246
  • Filename
    6420246