• DocumentCode
    3073378
  • Title

    Warning Prediction Sequential for Transient Error Prevention

  • Author

    Das, Bishnu Prasad ; Onodera, Hidetoshi

  • Author_Institution
    Grad. Sch. of Inf., Kyoto Univ., Kyoto, Japan
  • fYear
    2010
  • fDate
    6-8 Oct. 2010
  • Firstpage
    382
  • Lastpage
    390
  • Abstract
    Error Detection Sequential (EDS) is gaining enormous importance in timing error detection. In this work, we propose a warning detection scheme for sequential circuits which is very useful for dynamic, transient error prevention. The circuit consists of data edge detector, warning window generator and warning detector along with traditional Flip-flop. The delayed data is monitored during the warning window to flag a warning signal before the data enters the erroneous zone. We also propose an area efficient edge detector which reduces the area of the proposed FF substantially. The proposed circuit can be used in Dynamic Voltage Scaling (DVS) for low power application and helps in determining when to stop further reduction in supply voltage. It is also useful in avoiding delay degradation due to aging. The feasibility of the circuit is simulated in industrial 65 nm technology node.
  • Keywords
    alarm systems; error detection; flip-flops; low-power electronics; power supply circuits; data edge detector; delay degradation; dynamic voltage scaling; erroneous zone; error detection sequential; flip-flop; low power application; supply voltage; timing error detection; transient error prevention; warning detection; warning detector; warning prediction sequential circuit; warning signal; warning window generator; Aging; Clocks; Detectors; Flip-flops; Image edge detection; Monitoring; Timing; Aging circuit; Dynamic Voltage Scaling (DVS); Error Detection Sequential (EDS); Warning Prediction Sequential;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4244-8447-8
  • Type

    conf

  • DOI
    10.1109/DFT.2010.52
  • Filename
    5634939