DocumentCode :
3073399
Title :
A new innovative model for green QFN qualification
Author :
Jeffrey, ChangBing Lee ; Chang, Gee-Kung ; Chen, Ci ; ChengChih Chen ; Lin, James
Author_Institution :
IST-Integrated Service Technol., Hsinchu, Taiwan
fYear :
2012
fDate :
24-26 Oct. 2012
Firstpage :
212
Lastpage :
216
Abstract :
QFN (Quad flat no-lead) package has become a necessary IC package type covering low cost and high performance needs throughout consumer, telecommunication (wireless handset, power management, analog baseband and Bluetooth) to high end electronics product application due to its small form factor and excellent thermal and electrical performance compared to similar size IC package [1]. With more and more requirements, the QFN package is developed toward multi-row, thinner, large package size, high I/O around 100~400, fine pitch <;0.4mm, larger die supporting, Green compliance and so on. Compared with the FBGA, QFN can reduce IC package dimension to half due to substrate elimination, as well the entire packaging assembly cost can be reduce 25% [2, 3]. From the perspective of IC package designer and assembler, it will be more difficult to consider further the compatibility with the users like SMT assembler and PCB fabricator to well use the developing and innovative QFN package. Therefore, one new business model will be suggested to overcome the above issue [4]. In the paper, the real examples from the collaboration of supply chain on the green QFN package qualification through board level acceleration temperature cycling testing (ATC) will be taken to explain how to address the package verification from the design of package and PCB, PCB assembly, reliability test and failure analysis. The 3 key factors on the QFN package, PCB and PCBA must be incorporated for design consideration to conclude a total QFN package solution for end product application. Furthermore, the actual benefit in the supply chain will be also discussed in terms of collaboration working model.
Keywords :
integrated circuit packaging; integrated circuit reliability; printed circuit testing; supply chain management; IC package; PCB assembly; QFN package; collaboration; design of package; failure analysis; green QFN qualification; innovative model; package verification; reliability test; supply chain; temperature cycling testing; thermal and electrical performance; through board level acceleration; Collaboration; Companies; Integrated circuits; Reliability; Soldering; Supply chains; ATC; Open Collaboration; QFN; Supply chain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4673-1635-4
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2012.6420252
Filename :
6420252
Link To Document :
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