Title :
Recovery Method for a Laser Array Failure on Dynamic Optically Reconfigurable Gate Arrays
Author :
Seto, Daisaku ; Watanabe, Minoru
Author_Institution :
Electr. & Electron. Eng., Shizuoka Univ., Shizuoka, Japan
Abstract :
Demand is increasing daily for a large-gate-count robust VLSI chip that can be used in a radiation-rich space environment. Since they exploit the large storage capacity of a holographic memory, optically reconfigurable gate arrays (ORGAs) have been developed to realize a much larger virtual gate count than those of current VLSI chips. The ORGA architecture is extremely robust for many failure modes caused by high-energy charged particles. Among such developments, dynamic optically reconfigurable gate arrays (DORGAs) have been developed to realize a high-gate-density VLSI using a photodiode memory architecture. Unfortunately, the DORGA architecture is more sensitive to the unallowable turn-off failure mode of a laser array. Therefore, this paper presents a recovery method for a turn-off failure mode of a laser array on a DORGA and its demonstration results.
Keywords :
field programmable gate arrays; holographic storage; integrated optoelectronics; laser arrays; laser modes; optical logic; photodiodes; recovery; very high speed integrated circuits; dynamic optically reconfigurable gate arrays; field programmable gate arrays; high-gate-density VLSI chip; holographic memory storage capacity; laser array failure; photodiode memory architecture; recovery; unallowable turn-off failure mode; Arrays; Context; Holographic optical components; Holography; Laser modes; Logic gates; Defect tolerance; Field Programmable Gate Arrays; Laser arrays; Optically Reconfigurable Gate Arrays;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-8447-8
DOI :
10.1109/DFT.2010.55
