• DocumentCode
    3073589
  • Title

    Analog Design for a Power Transmission Line Sensing and Analysis VLSI Chip

  • Author

    MacLean, E. ; Jain, V.K.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    2010
  • fDate
    6-8 Oct. 2010
  • Firstpage
    438
  • Lastpage
    446
  • Abstract
    Considerable interest currently exists in the use of application-specific VLSI chips for the sensing and control of power systems with a view toward achieving smart grids. This paper describes such a chip, one that performs sensing, analog preprocessing and digital analysis, with emphasis here on the analog circuits. There are three major subsections in the chip: the magnetic field coils, the analog preprocessing section - that includes A-to-D conversion, and the digital processing section. Two coils are provided on chip, one of which serves to sense the ac magnetic field, and the other can serve either as a driver coil or as a redundant sensing coil. The magnetic field itself can be generated by the power transmission lines, or for test purposes by the second coil. The paper discusses the analog VLSI design and fault tolerance issues, including the effect of placement of the frontend at two very different locations, one inside the sensing coils and the other outside of them. This allows for the evaluation of the interference generated though inductive coupling.
  • Keywords
    VLSI; analogue integrated circuits; coils; integrated circuit design; magnetic fields; power grids; power system control; power transmission lines; A-to-D conversion; ac magnetic field; analog VLSI design; analog circuit; analog preprocessing; application-specific VLSI chip; digital analysis; digital processing; fault tolerance; inductive coupling; interference; magnetic field coil; power system control; power system sensing; power transmission line sensing; smart grid; Capacitors; Coils; Differential amplifiers; Layout; Magnetic fields; Power transmission lines; Sensors; analog design; defect tolerance; magnetic coils; power grid fault detection; power transmission line sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5774
  • Print_ISBN
    978-1-4244-8447-8
  • Type

    conf

  • DOI
    10.1109/DFT.2010.58
  • Filename
    5634951