Abstract :
The following topics are dealt with: defect and fault tolerance in VLSI systems; design for fault tolerance; yield analysis and dependability; testing and design for test; BIST and on-chip test generation; error detection; and error correction.
Keywords :
VLSI; built-in self test; design for testability; error correction; error detection; fault tolerance; integrated circuit testing; integrated circuit yield; BIST; VLSI systems; dependability; design for test; error correction; error detection; fault tolerance; on-chip test generation; testing; yield analysis;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-8447-8
