DocumentCode
3073787
Title
3D simulation of underfill encapsulation in semiconductor processing
Author
Chih-Chung Hsu ; Hsien-Sen Chiu ; Rong-Yeu Chang
Author_Institution
Dept. of Chem. Eng., Nat. Tsing-Hua Univ., Hsinchu, Taiwan
fYear
2012
fDate
24-26 Oct. 2012
Firstpage
224
Lastpage
227
Abstract
Semiconductor industry is the leader of industries in Taiwan for more than ten years. The development of microchip product is pretty complicated due to the complexity of material property while processing. Recently it becomes more arduous, because the trend of customer demand is driving the technology of IC packaging toward higher packaging densities with thinner and smaller profiles. Therefore, flip chips have recently gained popularity among manufacturers of many small electronics where the size savings are valuable. Especially, the short wires greatly reduce inductance, allowing higher-speed signals, and also carry heat better. However, fine pitch flip chip molding has difficulty meeting mechanical shock and prevention voids for underfill in on-site process. It becomes the most challenging in industry, so the conventional trial-and-error method is adopted previously to resolve these problems. Yet trial-and-error is difficult and costly because of the complex interactions among fluid flow, heat transfer, structural deformation and polymerization of the underfill. In this study, a 3D CAE simulation tool is proposed to accurately track the propagation of the underfill in microchips. The proposed methodology developed in this work accounts for most of the physical phenomena believed to play an important role in underfill flows. The results demonstrate not only show how an encapsulant fills an underfill gap, flowing around the bumps, but also simulate the interconnect area between a die and a substrate, and the area surrounding the die. The simulation results shows edge flow effect would help to pull the melt flow front in the bump array and formation of the fillet spread. By using the integrated analysis, molding defects can be easily detected and mold ability problems can be improved efficiently to reduce manufacturing cost and design cycle time.
Keywords
computer aided engineering; costing; dies (machine tools); digital simulation; electronic engineering computing; encapsulation; fine-pitch technology; flip-chip devices; heat transfer; inductance; integrated circuit packaging; microprocessor chips; moulding; semiconductor device manufacture; semiconductor industry; 3D CAE simulation tool; 3D simulation; IC packaging; bump array; customer demand; design cycle time; die; edge flow effect; encapsulant; fillet spread; fine pitch flip chip molding; flip chips; fluid flow; heat transfer; higher packaging density; higher-speed signals; inductance; integrated analysis; manufacturing cost; material property; mechanical shock; melt flow front; microchip product; microchips; moldability problems; molding defects; on-site process; polymerization; semiconductor industry; semiconductor processing; short wires; size savings; structural deformation; trial-and-error method; underfill encapsulation; underfill flows; Encapsulation; Filling; Flip chip; Heating; Numerical models; Surface tension; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4673-1635-4
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2012.6420273
Filename
6420273
Link To Document