• DocumentCode
    3074034
  • Title

    Phase equilibria of the Sn-Bi-Cu ternary system in advanced microelectronic packaging

  • Author

    Yee-Wen Yen ; Hsien-Ming Hsiao ; Gu-Jhong Jhang ; Han-Wei Shi ; Meng-Kuang Huang

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
  • fYear
    2012
  • fDate
    24-26 Oct. 2012
  • Firstpage
    388
  • Lastpage
    391
  • Abstract
    The Sn-Bi solder is a very common lead-free solder used in electronic packaging due to its low eutectic temperature (138°C). Copper is generally used as the substrate in a printed circuit board (PBC) and a metallic pad in the integrated circuit (IC) fabrication. Cu is also used as the under-bump metallurgy (UBM) of the flip chip (FC) package. Thus, for reliability of a solder-joint, it is necessary to make a clear understanding of the phase equilibria in the the Sn-Bi-Cu ternary system. In this study, the isothermal sections of the Sn-Bi-Cu ternary system were experimentally established at 400 and 120°C. The experimental results indicated that no ternary intermetallic compounds were found at both 400 and 120°C in Sn-Bi-Cu ternary system. The isothermal sections of the Sn-Bi-Cu ternary system at 400 and 120°C consist of five single-phase areas, seven two-phase areas, and three tie-triangles, respectively. The Cu3Sn phase is in equilibrium with most stable single phases in these two isothermal sections. This phase should be the most stable phase in the Sn-Bi-Cu ternary system.
  • Keywords
    flip-chip devices; integrated circuit packaging; integrated circuit reliability; integrated circuits; microfabrication; printed circuits; solders; FC package; IC fabrication; PBC; UBM; advanced microelectronic packaging; flip chip package; integrated circuit fabrication; lead-free solder; low eutectic temperature; metallic pad; phase equilibria; printed circuit board; reliability; ternary system; under-bump metallurgy; Annealing; Bismuth; Educational institutions; Isothermal processes; Tin; X-ray scattering; Isothermal section; Sn-Bi-Cu ternary system; lead-free solder; phase equilibria;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4673-1635-4
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2012.6420287
  • Filename
    6420287