DocumentCode
3074037
Title
Reliability-Driven System-Level Synthesis of Embedded Systems
Author
Bolchini, Cristiana ; Miele, Antonio
Author_Institution
Politec. di Milano, Dip. di Elettron. e Inf., Milan, Italy
fYear
2010
fDate
6-8 Oct. 2010
Firstpage
35
Lastpage
43
Abstract
This paper proposes an enhanced system-level synthesis flow for the design of reliable embedded systems, extending the classical process to introduce fault mitigation properties in the design under consideration. The strategy first explores the adoption of hardening techniques that, given the initial task graph and the user´s reliability requirements, introduce redundancies and mapping constraints on the available resources, which possibly expose fault detection/tolerance features. The reliability-aware task graph is then implemented by means of a classical mapping and scheduling approach thus obtaining the hardened implementation. Experimental results are reported to support the validity of the proposal.
Keywords
embedded systems; fault tolerance; redundancy; reliability; embedded system design; fault detection; fault mitigation properties; hardening techniques; mapping constraints; redundancies; reliability requirements; reliability-aware task graph; reliability-driven system-level synthesis; system-level synthesis flow; tolerance features; Circuit faults; Computer architecture; Fault detection; Fault tolerance; Fault tolerant systems; Reliability engineering; Reliability-driven design; design space exploration; embedded system design; system-level synthesis;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location
Kyoto
ISSN
1550-5774
Print_ISBN
978-1-4244-8447-8
Type
conf
DOI
10.1109/DFT.2010.11
Filename
5634978
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