Title :
Reliability-Driven System-Level Synthesis of Embedded Systems
Author :
Bolchini, Cristiana ; Miele, Antonio
Author_Institution :
Politec. di Milano, Dip. di Elettron. e Inf., Milan, Italy
Abstract :
This paper proposes an enhanced system-level synthesis flow for the design of reliable embedded systems, extending the classical process to introduce fault mitigation properties in the design under consideration. The strategy first explores the adoption of hardening techniques that, given the initial task graph and the user´s reliability requirements, introduce redundancies and mapping constraints on the available resources, which possibly expose fault detection/tolerance features. The reliability-aware task graph is then implemented by means of a classical mapping and scheduling approach thus obtaining the hardened implementation. Experimental results are reported to support the validity of the proposal.
Keywords :
embedded systems; fault tolerance; redundancy; reliability; embedded system design; fault detection; fault mitigation properties; hardening techniques; mapping constraints; redundancies; reliability requirements; reliability-aware task graph; reliability-driven system-level synthesis; system-level synthesis flow; tolerance features; Circuit faults; Computer architecture; Fault detection; Fault tolerance; Fault tolerant systems; Reliability engineering; Reliability-driven design; design space exploration; embedded system design; system-level synthesis;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-8447-8
DOI :
10.1109/DFT.2010.11