• DocumentCode
    3074051
  • Title

    Dissolution behaviors of the Ni and Ni3Sn4 phase in molten lead-free solders

  • Author

    Yee-Wen Yen ; Meng-Han Kuo ; Wei-kai Liou ; Tai-Ni Chu

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
  • fYear
    2012
  • fDate
    24-26 Oct. 2012
  • Firstpage
    392
  • Lastpage
    395
  • Abstract
    This study investigates the dissolution behavior of metallic substrates-Ni and IMC-Ni3Sn4 phase in molten Sn, SAC, SC, SB and SZ at 240, 270, and 300°C. The dissolution rates of the Ni substrate in molten solder follow the order Sn >; SAC >; SC >; SB >; SZ. Many the Ni3Sn4 phases with a small grain size were formed at the Sn/Ni system. Because a small grain could provide more groove to let Ni atoms dissolve in the molten Sn, the largest dissolution rate is in the Sn/Ni system. The dense Ni5(Zn, Sn)21 phase was formed in the SZ/Ni system. This dense layer inhibited the Ni atoms to dissolve into the molten solder. Thus, the SZ/Ni system has the lowest dissolution rate. The dissolution rate of the Ni3Sn4 substrate in molten solders follows the order Sn >; SAC >; SC >; SB at 240°C and Sn >; SC >; SAC >; SB at 300°C. There is no any IMC found in the Sn/Ni3Sn4 and SB/Ni systems. The (Cu, Ni)6Sn5 was observed in the SAC/Ni3Sn4 and SC/Ni3Sn4 systems. In the SZ/Ni3Sn4 system, the Ni5(Zn,Sn)21 phase was formed at the interface. Meanwhile, the Zn atoms diffused toward the Ni3Sn4 substrate to incorporate the sublattice of the Ni3Sn4 phase. Finally, the Ni3(Sn,Zn)4 layer was observed below the Ni5(Zn,Sn)21 phase.
  • Keywords
    solders; substrates; dissolution behavior; dissolution rates; metallic substrates; molten lead free solders; Aging; Lead; Nickel; Substrates; Tin; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4673-1635-4
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2012.6420288
  • Filename
    6420288