DocumentCode
3074051
Title
Dissolution behaviors of the Ni and Ni3 Sn4 phase in molten lead-free solders
Author
Yee-Wen Yen ; Meng-Han Kuo ; Wei-kai Liou ; Tai-Ni Chu
Author_Institution
Dept. of Mater. Sci. & Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fYear
2012
fDate
24-26 Oct. 2012
Firstpage
392
Lastpage
395
Abstract
This study investigates the dissolution behavior of metallic substrates-Ni and IMC-Ni3Sn4 phase in molten Sn, SAC, SC, SB and SZ at 240, 270, and 300°C. The dissolution rates of the Ni substrate in molten solder follow the order Sn >; SAC >; SC >; SB >; SZ. Many the Ni3Sn4 phases with a small grain size were formed at the Sn/Ni system. Because a small grain could provide more groove to let Ni atoms dissolve in the molten Sn, the largest dissolution rate is in the Sn/Ni system. The dense Ni5(Zn, Sn)21 phase was formed in the SZ/Ni system. This dense layer inhibited the Ni atoms to dissolve into the molten solder. Thus, the SZ/Ni system has the lowest dissolution rate. The dissolution rate of the Ni3Sn4 substrate in molten solders follows the order Sn >; SAC >; SC >; SB at 240°C and Sn >; SC >; SAC >; SB at 300°C. There is no any IMC found in the Sn/Ni3Sn4 and SB/Ni systems. The (Cu, Ni)6Sn5 was observed in the SAC/Ni3Sn4 and SC/Ni3Sn4 systems. In the SZ/Ni3Sn4 system, the Ni5(Zn,Sn)21 phase was formed at the interface. Meanwhile, the Zn atoms diffused toward the Ni3Sn4 substrate to incorporate the sublattice of the Ni3Sn4 phase. Finally, the Ni3(Sn,Zn)4 layer was observed below the Ni5(Zn,Sn)21 phase.
Keywords
solders; substrates; dissolution behavior; dissolution rates; metallic substrates; molten lead free solders; Aging; Lead; Nickel; Substrates; Tin; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4673-1635-4
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2012.6420288
Filename
6420288
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