• DocumentCode
    3074157
  • Title

    Measurement of the dielectric properties of materials by using time domain reflectometry

  • Author

    Nozaki, R. ; Bose, T.K.

  • Author_Institution
    Dept. de Phys., Quebec Univ., Trois-Rivieres, Que., Canada
  • fYear
    1990
  • fDate
    13-15 Feb 1990
  • Firstpage
    263
  • Lastpage
    269
  • Abstract
    The authors present some TDR (time-domain-reflectometry) applications for complex permittivity measurements for strong polar liquid in the frequency range of 1 to 35 GHz, liquid crystal from 100 kHz to 1 GHz, and ionic microemulsion at frequencies between 30 MHz and 20 GHz. In each case, the necessary TDR techniques for optimal condition are given. The new TDR system (HP54120A+HP54121A) used has excellent stability compared with the earlier TDR system (HP181). It was found that, for methanol, the TDR system implemented can obtain information about the complex permittivity in the frequency range up to 25 GHz with sufficient accuracy and can possibly go up to 35 GHz using a bilinear correction. In the case of the liquid crystal, it is shown that the method is powerful not only in the microwave range but also in the radio frequency range. From the measurement of the ionic microemulsion system, it is clear that the TDR technique is applicable to the measurement of the complex permittivity of a sample with high DC conductivity
  • Keywords
    emulsions; liquid crystals; permittivity measurement; time-domain reflectometry; 100 kHz to 35 GHz; DC conductivity; bilinear correction; complex permittivity measurements; dielectric properties of materials; ionic microemulsion; liquid crystal; methanol; oil in water emulsion; stability; strong polar liquid; time domain reflectometry; Conductivity measurement; Crystalline materials; Dielectric materials; Dielectric measurements; Frequency; Liquid crystals; Methanol; Permittivity measurement; Stability; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1990. IMTC-90. Conference Record., 7th IEEE
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/IMTC.1990.66014
  • Filename
    66014