DocumentCode
3074276
Title
The comparison on the corrosion resistance of different kinds of PCB surface finishing: OSP, LF HASL and ENIG
Author
Wei-Shan Chao ; Wen-Hao Wang ; Tzeng-Cherng Luo ; Te-Chun Huang ; Meng-Chieh Liao ; Tzu-Hsia Wei
Author_Institution
CERL Lab. & PCB CE, Inventec Corp. (Taoyuan), Tachi, Taiwan
fYear
2012
fDate
24-26 Oct. 2012
Firstpage
159
Lastpage
162
Abstract
This study focuses on the evaluation and comparison on the corrosion resistance of different kinds of surface finishing on printed circuit boards (PCBs) under high sulfur environments. The modeling clay being used is made by Chavant (type J-525) Company in this experiment. The content of sulfur in this clay was measured by an X-ray energy dispersive spectroscope and was about 18% (weight percentage). Clays containing sulfur were heated with water to simulate high sulfur environment and to drive creep corrosion on organic solderability preservative (OSP), lead free hot air solder level (LF HASL) and electroless nickel immersion gold (ENIG) PCB finishing via plugging methods and paste test via. The corrosion rate and the dendrite length of creep corrosion will increase when the retention time increases. The creep distance and the content of copper sulfide in the corrosion area were dependent on the relative location of the pad edges and the solder mask. Eight test conditions were examined with varying sizes of via plugging and paste test via. The results indicated that there are no obvious corrosion found in both via plugging and paste test via. The more via is plugged, the more corrosion resistance is achieved. Pasting test via can also enhance the corrosion resistance ability. The creep corrosion began by growth of dendrites on pad edges and the creep corrosion was detected by SEM-EDS. Copper sulfide was the main components of creep corrosion regions. ENIG PCB has the best corrosion resistance ability, whereas LFHASL PCB and OSP PCB can have the same creep corrosion resistance ability as ENIG with via plugging and paste test via processes.
Keywords
X-ray chemical analysis; clay; corrosion resistance; dendrites; masks; printed circuits; scanning electron microscopy; solders; surface finishing; vias; Chavant Company; ENIG PCB; LF HASL PCB; OSP PCB; PCB surface finishing; SEM-EDS; X-ray energy dispersive spectroscope; copper sulfide; corrosion area; corrosion rate; corrosion resistance ability; creep corrosion regions; creep distance; dendrite growth; dendrite length; electroless nickel immersion gold; high sulfur environments; lead free hot air solder level; modeling clay; organic solderability preservative; paste test via; plugging methods; printed circuit boards; retention time; solder mask; Copper; Corrosion; Creep; Surface finishing; Surface resistance; Copper sulfur; Corrosion resistance; Creep corrosion; High sulfur environment; PCB;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
Conference_Location
Taipei
ISSN
2150-5934
Print_ISBN
978-1-4673-1635-4
Electronic_ISBN
2150-5934
Type
conf
DOI
10.1109/IMPACT.2012.6420301
Filename
6420301
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