• DocumentCode
    3074303
  • Title

    Packaging designs and flexural stress estimation for thin-film types of OLED devices

  • Author

    Chang-Chun Lee ; Chih-Sheng Wu ; Tzai-Liang Tzeng ; Chia-Hao Tsai ; Shu-Tang Yeh ; Yi-Hao Peng ; Kuang-Jung Chen

  • Author_Institution
    Dept. of Mech. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
  • fYear
    2012
  • fDate
    24-26 Oct. 2012
  • Firstpage
    415
  • Lastpage
    418
  • Abstract
    Fatigue behavior with an extreme flexural stress loaded on OLED devices has been greatly paid attention while the packaging structure having multi-stacked films becomes thinner and more flexible. To reduce mechanical impact and enhance reliability for OLED and related critical film materials, a derived mechanical model of plural layers is presented. Moreover, a nonlinear finite element analysis combined with the approach of full factorial design is performed to explore several concerned mechanical parameters within a whole structure. The results reveal that the thickness of PI_substrate is the most dominant to determine the position of neutral axis and the bending stress of indium tin oxide film, separately. It is also found that all the significances of main effects for each factor are obviously larger than the interaction effect among them. Consequently, the use of either thinner film or softer constitute for each layer could be able to reduce ITO stress effectively.
  • Keywords
    electronics packaging; organic light emitting diodes; OLED devices; bending stress; critical film materials; fatigue behavior; flexural stress estimation; interaction effect; mechanical impact; packaging designs; reliability; thin-film types; Films; Indium tin oxide; Organic light emitting diodes; Packaging; Stress; Substrates; Young´s modulus; Finite element analysis (FEA); Flexural stress; ITO; Neural axis; OLED;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT), 2012 7th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4673-1635-4
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2012.6420302
  • Filename
    6420302