DocumentCode :
3074348
Title :
A study of electrical properties on nc-Si/c-Si heterojunction diodes
Author :
Yuliang, He ; Yingcai, Peng ; Minbin, Yu ; Ming, Liu ; Yuexia, Li ; Gangyi, Xu ; Jiajun, Luo ; Tianmin, Wang
Author_Institution :
Res. Center of Mater. Phys. & Chem., Beijing Univ. of Aeronaut. & Astronaut., China
fYear :
1998
fDate :
1998
Firstpage :
849
Lastpage :
852
Abstract :
Nanocrystalline silicon films on crystalline silicon diodes were fabricated and electrically characterized. The nc-Si:H film was deposited by plasma enhanced chemical vapor deposition. With the difference of the thickness of the nc-Si:H film and the doping type of the c-Si substrate two kinds of diodes, tunneling diodes and heterojunction diodes, were formed. For the tunneling diode, resonant tunneling and quantum staircases were observed in its I-V and σ-V curves in liquid nitrogen temperature range (~77 K). For heterojunction diodes, we found some unique characters differing from other semiconductor heterojunctions. Both of these devices indicate quantum tunneling features in the conduction mechanism
Keywords :
elemental semiconductors; hydrogen; nanostructured materials; plasma CVD; resonant tunnelling diodes; silicon; σ-V curves; 77 K; I-V curves; PECVD; Si; Si:H-Si; heterojunction diodes; nanocrystalline films; quantum staircases; quantum tunneling; resonant tunneling; tunneling diodes; Chemical vapor deposition; Crystallization; Doping; Heterojunctions; Plasma chemistry; Plasma properties; Semiconductor diodes; Semiconductor films; Silicon; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-4306-9
Type :
conf
DOI :
10.1109/ICSICT.1998.786455
Filename :
786455
Link To Document :
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