• DocumentCode
    3074348
  • Title

    A study of electrical properties on nc-Si/c-Si heterojunction diodes

  • Author

    Yuliang, He ; Yingcai, Peng ; Minbin, Yu ; Ming, Liu ; Yuexia, Li ; Gangyi, Xu ; Jiajun, Luo ; Tianmin, Wang

  • Author_Institution
    Res. Center of Mater. Phys. & Chem., Beijing Univ. of Aeronaut. & Astronaut., China
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    849
  • Lastpage
    852
  • Abstract
    Nanocrystalline silicon films on crystalline silicon diodes were fabricated and electrically characterized. The nc-Si:H film was deposited by plasma enhanced chemical vapor deposition. With the difference of the thickness of the nc-Si:H film and the doping type of the c-Si substrate two kinds of diodes, tunneling diodes and heterojunction diodes, were formed. For the tunneling diode, resonant tunneling and quantum staircases were observed in its I-V and σ-V curves in liquid nitrogen temperature range (~77 K). For heterojunction diodes, we found some unique characters differing from other semiconductor heterojunctions. Both of these devices indicate quantum tunneling features in the conduction mechanism
  • Keywords
    elemental semiconductors; hydrogen; nanostructured materials; plasma CVD; resonant tunnelling diodes; silicon; σ-V curves; 77 K; I-V curves; PECVD; Si; Si:H-Si; heterojunction diodes; nanocrystalline films; quantum staircases; quantum tunneling; resonant tunneling; tunneling diodes; Chemical vapor deposition; Crystallization; Doping; Heterojunctions; Plasma chemistry; Plasma properties; Semiconductor diodes; Semiconductor films; Silicon; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-4306-9
  • Type

    conf

  • DOI
    10.1109/ICSICT.1998.786455
  • Filename
    786455