• DocumentCode
    3076028
  • Title

    Designing in reliability with standard cells

  • Author

    Brown, Thornas H. ; Locke, Donald G. ; Daughton, William

  • Author_Institution
    NCR Microelectron., Colorado Springs, CO, USA
  • fYear
    1989
  • fDate
    22-26 May 1989
  • Firstpage
    1977
  • Abstract
    The authors show the advantages of using generic standard-cell data in qualifying a military product. They describe the proposed methodology used in qualifying ASIC (application-specific integrated circuit) standard-cell devices for military use. Reliability results of using standard cells and recommendations for qualifying military standard-cell products are presented. It is noted that this new approach to qualifying ASIC standard-cell library devices for a military environment allows new designs to be introduced at a minimal cost and insures reliability at the same time
  • Keywords
    application specific integrated circuits; cellular arrays; circuit reliability; military equipment; ASIC; cost; military product; reliability; standard cells; standard-cell library devices; Application specific integrated circuits; Libraries; Manufacturing; Microelectronics; Military standards; Performance evaluation; Qualifications; Silicon; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National
  • Conference_Location
    Dayton, OH
  • Type

    conf

  • DOI
    10.1109/NAECON.1989.40489
  • Filename
    40489