DocumentCode
3076137
Title
Enhancement of quantum well intermixing through sputtered SiO2 on InGaAs layer
Author
Chen, Rui-Ren ; Wu, Jui-Pin ; Ding, Wei-Zun ; Tseng, Ling-Yu ; Chiu, Yi-Jen
Author_Institution
Inst. of Electro-Opt. Eng., Nat. Sun Yat-Sen Univ., Kaoshiung, Taiwan
fYear
2012
fDate
2-6 July 2012
Firstpage
245
Lastpage
246
Abstract
Enhancement of quantum well intermixing (QWI) through sputtered SiO2 on InGaAs layer is demonstrated. From large thermal expansion coefficient, blue shift of 60nm improvement over InP junction, also verified by laser fabrication.
Keywords
III-V semiconductors; gallium arsenide; indium compounds; semiconductor growth; semiconductor quantum wells; semiconductor thin films; sputter deposition; thermal expansion; SiO2-InGaAs; blue shift; laser facbrication; quantum well intermixing; sputtered layer; thermal expansion coefficient; Annealing; Indium gallium arsenide; Indium phosphide; Optical device fabrication; Optical waveguides; Thermal expansion;
fLanguage
English
Publisher
ieee
Conference_Titel
Opto-Electronics and Communications Conference (OECC), 2012 17th
Conference_Location
Busan
ISSN
2166-8884
Print_ISBN
978-1-4673-0976-9
Electronic_ISBN
2166-8884
Type
conf
DOI
10.1109/OECC.2012.6276462
Filename
6276462
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