• DocumentCode
    3076759
  • Title

    Head modeling and cortical source localization in epilepsy

  • Author

    Acar, Zeynep Akalin ; Makeig, Scott ; Worrell, Gregory

  • Author_Institution
    Swartz Center for Computational Neuroscience, Institute for Neural Computation, University of California San Diego, La Jolla, USA
  • fYear
    2008
  • fDate
    20-25 Aug. 2008
  • Firstpage
    3763
  • Lastpage
    3766
  • Abstract
    In this study, we developed numerical methods for investigating the dynamics of epilepsy from multi-scale EEG recordings acquired simultaneously from the scalp (sEEG) and intracranial subdural and/or depth electrodes (iEEG) in patients undergoing pre-surgical evaluation at the epilepsy center of the Mayo Clinic (Rochester, MN). The data are analyzed using independent component analysis (ICA), which identifies and isolates independent signal components from multi-channel recordings. A realistic individual head model was constructed for a patient undergoing pre-surgical evaluation. The forward problem of electro-magnetic source localization was solved using the Boundary Element Method (BEM). Using this approach, we investigated the relationships between noninvasive and invasive source localization of human electrical brain data sources. A difference of about 1 cm was observed between sources estimated from sEEG and iEEG measurements.
  • Keywords
    Brain modeling; Data analysis; Electrodes; Electroencephalography; Epilepsy; Independent component analysis; Magnetic heads; Scalp; Signal analysis; Signal processing; Algorithms; Cerebral Cortex; Computer Simulation; Diagnostic Imaging; Electroencephalography; Electrophysiology; Epilepsy; Finite Element Analysis; Head; Humans; Image Processing, Computer-Assisted; Magnetic Resonance Imaging; Models, Anatomic; Principal Component Analysis; Tomography, X-Ray Computed;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
  • Conference_Location
    Vancouver, BC
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-1814-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2008.4650027
  • Filename
    4650027