DocumentCode
3077196
Title
Analysis of the impedance resonance of piezoelectric stacks
Author
Sherrit, S. ; Leary, S.P. ; Bar-Cohen, Y. ; Dolgin, B.P. ; Tasker, R.
Author_Institution
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume
2
fYear
2000
fDate
36800
Firstpage
1037
Abstract
Inversion techniques to determine the complex material constants from the impedance data of a zero bond-length stack resonator are studied. The impedance equation examined in this paper is based on the derivation by Martin [G.E. Martin, JASA, 36, pp. 1496-1506, 1964]. The asymptotic solutions for the case where the number of layers n is large (n>8) and n small (n⩽2) are presented in terms of the complex material constants of the piezoelectric. When n =1 or 2, it is shown that the wave speed in the stack is determined by the open circuit elastic constant SD33. In the limit of large n, the wave speed is determined by the short circuit elastic constant SE33. Techniques to invert the impedance data to determine complex material constants are presented for all values of n. The error associated with using the impedance equations derived from fully short and fully open electrical boundary conditions is investigated. Since the model is based on material properties rather than circuit constants, it allows for the direct evaluation of specific aging or degradation mechanisms
Keywords
boundary-value problems; crystal resonators; elastic constants; electric admittance; electric impedance; equivalent circuits; iterative methods; matrix inversion; permittivity; piezoelectric materials; admittance; asymptotic solutions; complex material constants; elastic compliance; electrical boundary conditions; equivalent circuit; impedance equations; impedance resonance; inversion techniques; iteration; open circuit elastic constant; piezoelectric stacks; short circuit elastic constant; zero bond-length stack resonator; Aging; Bonding; Boundary conditions; Circuits; Degradation; Equations; Impedance; Material properties; Piezoelectric materials; Resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2000 IEEE
Conference_Location
San Juan
ISSN
1051-0117
Print_ISBN
0-7803-6365-5
Type
conf
DOI
10.1109/ULTSYM.2000.921502
Filename
921502
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