DocumentCode
3077259
Title
Performance and Language Compatibility in Software Pattern Detection
Author
Tripathi, Vikas ; Mahesh, T. Sai Guru ; Srivastava, Anurag
Author_Institution
Comput. Sci. & Technol. Lab., ABV-Indian Inst. of Inf. Technol. & Manage., Gwalior
fYear
2009
fDate
6-7 March 2009
Firstpage
1639
Lastpage
1643
Abstract
Re documentation and design recovery are two important areas of reverse engineering. Detection of recurring organizations of classes and communicating objects, called software patterns, supports this process. Many approaches to detect software patterns which have been published in the past years suffer from the problems of necessity of reference library, performance and language compatibility. This paper presents a model to solve those problems in software pattern detection. The proposed model solves the problem of necessity of reference library by detecting software patterns using formal concept analysis (FCA). The proposed model solves the problem of performance by using the most efficient algorithm CMCG (Concept-Matrix Based Concepts Generation) for the construction of concept lattice, which is the core data structure of FCA. The proposed model solves the problem of language compatibility by using the language independent meta model called MOOSE for taking the input information. The validity of this model was proved in theory and by experiment.
Keywords
matrix algebra; object-oriented programming; reverse engineering; system documentation; MOOSE; concept-matrix based concept generation; design recovery; formal concept analysis; language compatibility; language independent metamodel; redocumentation; reverse engineering; software pattern detection; Application software; Conference management; Engineering management; Gamma ray detection; Gamma ray detectors; Java; Reverse engineering; Software libraries; Software performance; Technology management; design recovery; reengineering; reverse engineering; software patterns;
fLanguage
English
Publisher
ieee
Conference_Titel
Advance Computing Conference, 2009. IACC 2009. IEEE International
Conference_Location
Patiala
Print_ISBN
978-1-4244-2927-1
Electronic_ISBN
978-1-4244-2928-8
Type
conf
DOI
10.1109/IADCC.2009.4809263
Filename
4809263
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