• DocumentCode
    3077259
  • Title

    Performance and Language Compatibility in Software Pattern Detection

  • Author

    Tripathi, Vikas ; Mahesh, T. Sai Guru ; Srivastava, Anurag

  • Author_Institution
    Comput. Sci. & Technol. Lab., ABV-Indian Inst. of Inf. Technol. & Manage., Gwalior
  • fYear
    2009
  • fDate
    6-7 March 2009
  • Firstpage
    1639
  • Lastpage
    1643
  • Abstract
    Re documentation and design recovery are two important areas of reverse engineering. Detection of recurring organizations of classes and communicating objects, called software patterns, supports this process. Many approaches to detect software patterns which have been published in the past years suffer from the problems of necessity of reference library, performance and language compatibility. This paper presents a model to solve those problems in software pattern detection. The proposed model solves the problem of necessity of reference library by detecting software patterns using formal concept analysis (FCA). The proposed model solves the problem of performance by using the most efficient algorithm CMCG (Concept-Matrix Based Concepts Generation) for the construction of concept lattice, which is the core data structure of FCA. The proposed model solves the problem of language compatibility by using the language independent meta model called MOOSE for taking the input information. The validity of this model was proved in theory and by experiment.
  • Keywords
    matrix algebra; object-oriented programming; reverse engineering; system documentation; MOOSE; concept-matrix based concept generation; design recovery; formal concept analysis; language compatibility; language independent metamodel; redocumentation; reverse engineering; software pattern detection; Application software; Conference management; Engineering management; Gamma ray detection; Gamma ray detectors; Java; Reverse engineering; Software libraries; Software performance; Technology management; design recovery; reengineering; reverse engineering; software patterns;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advance Computing Conference, 2009. IACC 2009. IEEE International
  • Conference_Location
    Patiala
  • Print_ISBN
    978-1-4244-2927-1
  • Electronic_ISBN
    978-1-4244-2928-8
  • Type

    conf

  • DOI
    10.1109/IADCC.2009.4809263
  • Filename
    4809263