DocumentCode :
3077662
Title :
Aluminum thick-metal-backed circuits: conductive adhesive technology
Author :
Light, David N. ; Jimarez, Lisa J. ; Egitto, Frank D. ; Matienzo, Luis J. ; Logan, Paul E. ; Seman, Andrew M.
Author_Institution :
Microelectron., IBM Corp., Endicott, NY, USA
fYear :
1996
fDate :
28-31 May 1996
Firstpage :
588
Lastpage :
598
Abstract :
Thick-metal-backed printed wiring boards are commonly used in high frequency wireless circuit applications requiring significant thermal dissipation, such as power amplifiers. The thick metal backer (TMB) typically functions as a ground plane, heat sink, and in some cases, part of a shielded housing. Electrical interconnections between RF/microwave printed wiring boards (PWBs) and TMBs have traditionally been accomplished using sweat soldering, plated through holes, or mechanical interconnections. More recently, conductive adhesive technology has been investigated to mechanically and electrically interconnect the PWB to the thick metal ground plane, due to perceived advantages in cost and performance. However, providing mechanically and electrically stable interfaces between conductive adhesives and large area metal surfaces has proven to be a significant challenge, particularly in the case of aluminum-backed circuits. Aluminum, while a cost effective material for these applications, is prone to hydrolytic processes induced by moisture and accelerated by temperature, active ionic species, galvanic effects, and other environmental factors. These processes can compromise both the electrical and mechanical stability of the bond, and thus the performance and reliability of the packaging structure. This paper describes work performed at IBM Microelectronics to understand the interfacial resistance between conductive adhesives and typical metal bonding surfaces for TMB printed circuits, and will discuss how reliable and functional adhesive interconnections were achieved for commercial designs using appropriate adherend pretreatment, mechanical design, and adhesive material
Keywords :
UHF circuits; adhesion; aluminium; conducting polymers; environmental degradation; environmental testing; heat sinks; humidity; mechanical stability; mechanical testing; microwave circuits; packaging; printed circuit manufacture; printed circuit testing; stability; surface treatment; Al; Al thick-metal-backed circuits; RF PWB; adherend pretreatment; adhesive interconnections; adhesive material; adhesive/metal interface; conductive adhesive technology; heat sink; humid environment testing; interfacial resistance; mechanical design; microwave PWB; printed wiring boards; stud tests; thermal dissipation; thick metal ground plane; wedge testing; Aluminum; Bonding; Conducting materials; Conductive adhesives; Costs; Frequency; High power amplifiers; Integrated circuit interconnections; Surface resistance; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1996. Proceedings., 46th
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-3286-5
Type :
conf
DOI :
10.1109/ECTC.1996.551420
Filename :
551420
Link To Document :
بازگشت