Investigation of the polarization depth distribution of PZT thick films by LIMM

Author

Ploss, Bernd ; Hässler, W. ; Hülz, H. ; Köbernik, G.

Author_Institution

Hong Kong Polytech. Univ., Kowloon, Hong Kong

fYear

1998

fDate

1998

Firstpage

207

Lastpage

210

Abstract

The pyroelectric Laser Intensity Modulation Method (LIMM) was applied for the characterization of the polarization depth distribution of ferroelectric thick films. The influence of an corona discharge on the polarization distribution of polarized and depolarized regions was investigated. Inhomogeneities in the surface potential of corona charged films can be correlated to inhomogeneities in the microstructure by a x-y-scan of the sample at different modulation frequencies (pyroelectric tomography)

Keywords

corona; crystal microstructure; dielectric polarisation; ferroelectric materials; lead compounds; measurement by laser beam; optical modulation; photothermal effects; pyroelectricity; surface charging; surface potential; thick films; LIMM; PZT; PZT thick films; PbZrO3TiO3; corona charged films; corona discharge; depolarized regions; ferroelectric thick films; inhomogeneities; microstructure; modulation frequencies; polarization depth distribution; polarized region; pyroelectric laser intensity modulation method; pyroelectric tomography; surface potential; Corona; Ferroelectric films; Ferroelectric materials; Frequency modulation; Intensity modulation; Microstructure; Polarization; Pyroelectricity; Surface discharges; Thick films;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics, 1998. ISAF 98. Proceedings of the Eleventh IEEE International Symposium on

Conference_Location

Montreux

ISSN

1099-4734

Print_ISBN

0-7803-4959-8

Type

conf

DOI

10.1109/ISAF.1998.786671

Filename

786671