Title :
Iterative Cross-Entropy Encoding for Memory Systems with Stuck-At Errors
Author :
Hwang, Euiseok ; Narayanaswamy, Balakrishnan ; Negi, Rohit ; Kumar, B. V K Vijaya
Author_Institution :
Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
In this paper, a novel iterative encoding scheme is proposed for memory systems suffering from stuck-at errors. The stuck-at errors can be efficiently managed by using side information about stuck-at memory cells during encoding, while encoding for unconstrained number of stuck-at errors is intractable due to its exponential complexity. The proposed coding scheme employs an iterative encoding algorithm using cross-entropy method, which has a polynomial time complexity. In addition, any linear block code (LBC) can be concatenated with the proposed code, to correct for both residual stuck-at errors and random (soft) errors. The proposed coding schemes are evaluated by numerical simulations using a memory channel undergoing both stuck-at and random errors. Simulation results show that the cross-entropy based coding scheme provides an improved block error rate (BLER) performance, or alternatively, a higher overall storage capacity.
Keywords :
block codes; concatenated codes; entropy codes; iterative decoding; linear codes; random-access storage; semiconductor storage; block error rate performance; concatenated code; iterative cross entropy encoding; iterative encoding; linear block code; memory systems; polynomial time complexity; random error; side information; soft error; storage capacity; stuck at errors; Additives; Complexity theory; Decoding; Encoding; Error analysis; Nonvolatile memory; Numerical simulation;
Conference_Titel :
Global Telecommunications Conference (GLOBECOM 2011), 2011 IEEE
Conference_Location :
Houston, TX, USA
Print_ISBN :
978-1-4244-9266-4
Electronic_ISBN :
1930-529X
DOI :
10.1109/GLOCOM.2011.6134073