Title :
Comparing the dynamic behavior between LFSRs and counting techniques
Author :
Seireg, Reda ; Vacroux, Andre´
Author_Institution :
MTRC for Armed Forces, Egypt
Abstract :
Transition counting is one of the schemes which is used for testing digital circuits. A relation for the aliasing error probability has been deduced which depends on the length of the input pattern. Previously, we have proved that the final value for aliasing error probability for both linear and counting techniques are similar. However, the practical results indicate that the linear technique has a better performance than the counting technique. We study the dynamic behavior for the counting technique. The results are discussed and compared with the results obtained from the linear technique which supports the empirical and practical conclusions for the superiority of the LFSR
Keywords :
Markov processes; circuit feedback; counting circuits; fault diagnosis; integrated logic circuits; logic testing; probability; shift registers; LFSR; Markov processes; aliasing error probability; compression techniques; counting techniques; digital circuit testing; dynamic behavior; input pattern length; linear feedback shift registers; linear techniques; performance; transition counting; Circuit testing; Digital circuits; EMTP; Equations; Error probability; Markov processes; Performance evaluation; Polynomials; Shift registers; Transforms;
Conference_Titel :
Radio Science Conference, 1996. NRSC '96., Thirteenth National
Conference_Location :
Cairo
Print_ISBN :
0-7803-3656-9
DOI :
10.1109/NRSC.1996.551425
