Title :
Trigonometric method to handle realistic error probabilities in logic circuits
Author :
Yu, Chien-Chih ; Hayes, John P.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
We present a novel trigonometry-based probability calculation (TPC) method for analyzing circuit behavior and reliability in the presence of errors that occur with extremely low probability. Signal and error probabilities are represented by trigonometric functions controlled by their corresponding angles. By combining trigonometric identities and Taylor expansions, the effect of an error at a particular gate is simulated as a rotation. In addition, the correlations among signals caused by reconvergence are carefully handled. The TPC method is shown to be more scalable and accurate than prior approaches, especially for very low-probability errors. We measure the performance of TPC by applying it to the ISCAS and LGSyn-91 benchmark circuits. Experimental results show that TPC achieves near-linear runtime complexity even with the largest circuits, while the accuracy gradually increases with decreasing error probabilities.
Keywords :
error statistics; integrated circuit reliability; logic circuits; probability; TPC method; Taylor expansion; circuit behavior; circuit reliability; linear runtime complexity; logic circuit; realistic error probability; signal probability; trigonometric function; trigonometric identity; trigonometric method; trigonometry-based probability calculation; Accuracy; Correlation; Error probability; Integrated circuit modeling; Logic gates; Probabilistic logic; Error modeling; logic circuits; probabilistic analysis; reliability; soft errors;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
Print_ISBN :
978-1-61284-208-0
DOI :
10.1109/DATE.2011.5763019