Scanning nonlinear dielectric microscope with submicron resolution

Author

Cho, Yasuo ; Matsuura, Kaori ; Yamanouchi, Kazuhiko

Author_Institution

Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan

fYear

1998

fDate

1998

Firstpage

435

Lastpage

438

Abstract

This article describes a new purely electrical technique for imaging the state of remanent polarization of a ferroelectric material by measuring the microscopic point-to-point variation of its nonlinear dielectric constants. First, the theory for detecting polarization is described. Secondly, the technique for measuring the nonlinear dielectric response is described. Finally, using this new microscope, area scans are obtained of the polarization domains in a periodically polarized and a multidomain lithium tantalate substrate, and of lead zirconate titanate ceramic and thin film

Keywords

dielectric measurement; dielectric polarisation; electric domains; ferroelectric ceramics; ferroelectric materials; ferroelectric thin films; lead compounds; lithium compounds; permittivity; permittivity measurement; scanning probe microscopy; LiTaO₃; PZT; PbZrO3TiO3; area scans; electrical technique; ferroelectric material; lead zirconate titanate ceramic; microscopic point-to-point variation; multidomain lithium tantalate substrate; nonlinear dielectric constants; nonlinear dielectric response; polarization domains; remanent polarization; scanning nonlinear dielectric microscope; submicron resolution; thin film; Dielectric constant; Dielectric measurements; Dielectric substrates; Dielectric thin films; Electric variables measurement; Ferroelectric materials; Lithium compounds; Microscopy; Polarization; Titanium compounds;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics, 1998. ISAF 98. Proceedings of the Eleventh IEEE International Symposium on

Conference_Location

Montreux

ISSN

1099-4734

Print_ISBN

0-7803-4959-8

Type

conf

DOI

10.1109/ISAF.1998.786725

Filename

786725