DocumentCode
3078736
Title
Activation, aggregation and adhesion of platelets exposed to high intensity focused ultrasound
Author
Poliachik, Sandra L. ; Chandler, Wayne L. ; Mourad, Pierre D. ; Ollos, Ryan J. ; Crum, Lawrence A.
Author_Institution
Appl. Phys. Lab., Washington Univ., Seattle, WA, USA
Volume
2
fYear
2000
fDate
36800
Firstpage
1433
Abstract
High intensity focused ultrasound (HIFU) is being considered as a noninvasive method to halt internal bleeding, thus we investigated the capability of HIFU to produce “acoustic primary hemostasis”, including platelet activation, aggregation and adhesion to a collagen-coated surface. Various HIFU doses were applied to platelet rich plasma (PRP) with and without ultrasound contrast agents. Flow cytometry, laser aggregometry, environmental scanning electron microscopy and passive cavitation detection were used to quantify platelet activation, aggregation, adhesion and associated cavitation. HIFU can activate platelets and cause them to adhere to a collagen-coated surface. Cavitation was monitored during aggregation trials and was quantified to provide a relative measure of the amount of cavitation that occurred in each aggregation trial. Regression analysis shows weak correlation between aggregation and intensity, and a strong correlation between aggregation and cavitation occurrence
Keywords
adhesion; biomedical ultrasonics; blood; cavitation; coagulation; haemorheology; radiation therapy; acoustic primary hemostasis; coagulation; collagen-coated surface; environmental SEM; flow cytometry; high intensity focused ultrasound exposure; internal bleeding; laser aggregometry; noninvasive method; passive cavitation detection; platelet activation; platelet adhesion; platelet aggregation; platelet rich plasma; protein p-selectin; regression analysis; ultrasound contrast agents; Adhesives; Aggregates; Blood; Humans; Laboratories; Physics; Plugs; Surface morphology; Ultrasonic imaging; Ultrasonic variables measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2000 IEEE
Conference_Location
San Juan
ISSN
1051-0117
Print_ISBN
0-7803-6365-5
Type
conf
DOI
10.1109/ULTSYM.2000.921592
Filename
921592
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