DocumentCode
3078960
Title
Decision ordering based property decomposition for functional test generation
Author
Chen, Mingsong ; Mishra, Prabhat
Author_Institution
Software Eng. Inst., East China Normal Univ., Shanghai, China
fYear
2011
fDate
14-18 March 2011
Firstpage
1
Lastpage
6
Abstract
SAT-based BMC is promising for directed test generation since it can locate the reason of an error within a small bound. However, due to the state space explosion problem, BMC cannot handle complex designs and properties. Although various optimization methods are proposed to address a single complex property, the test generation process cannot be fully automated. This paper presents an efficient automated approach that can scale down the falsification complexity using property decomposition and learning techniques. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically reduce the overall test generation effort.
Keywords
automatic test pattern generation; computability; electronic engineering computing; formal verification; SAT-based BMC; bounded model checking; decision ordering based property decomposition; falsification complexity; functional test generation; learning technique; satisfiability; state space explosion problem; Algorithm design and analysis; Arrays; Clocks; Clustering algorithms; Complexity theory; Delay; Equations;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location
Grenoble
ISSN
1530-1591
Print_ISBN
978-1-61284-208-0
Type
conf
DOI
10.1109/DATE.2011.5763037
Filename
5763037
Link To Document