• DocumentCode
    3078960
  • Title

    Decision ordering based property decomposition for functional test generation

  • Author

    Chen, Mingsong ; Mishra, Prabhat

  • Author_Institution
    Software Eng. Inst., East China Normal Univ., Shanghai, China
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    SAT-based BMC is promising for directed test generation since it can locate the reason of an error within a small bound. However, due to the state space explosion problem, BMC cannot handle complex designs and properties. Although various optimization methods are proposed to address a single complex property, the test generation process cannot be fully automated. This paper presents an efficient automated approach that can scale down the falsification complexity using property decomposition and learning techniques. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically reduce the overall test generation effort.
  • Keywords
    automatic test pattern generation; computability; electronic engineering computing; formal verification; SAT-based BMC; bounded model checking; decision ordering based property decomposition; falsification complexity; functional test generation; learning technique; satisfiability; state space explosion problem; Algorithm design and analysis; Arrays; Clocks; Clustering algorithms; Complexity theory; Delay; Equations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763037
  • Filename
    5763037