DocumentCode :
3079163
Title :
Translating relational & Object-Relational Database models into OWL models
Author :
Albarrak, Khalid M. ; Sibley, Edgar H.
Author_Institution :
Dept. of Comput. Sci., George Mason Univ., Fairfax, VA, USA
fYear :
2009
fDate :
10-12 Aug. 2009
Firstpage :
336
Lastpage :
341
Abstract :
We describe an extensible framework for translating data models into ontology models. Initially, the framework addresses two types of source data models: the relational database (RDB) and object-relational database (ORDB) models. The derived ontology model is based on OWL. The framework extracts information about the source data models from the metadata maintained by the DBMS. The extracted metadata includes most of the integrity constraints that are typically maintained by a DBMS. The extracted metadata is then analyzed to identify ontology concepts, properties, and explicit relationships, discover redundant ontology concepts and implicit relationships, and identify restrictions on properties and relationships. The analysis is based on heuristic database modeling techniques. The analyzed data is automatically translated into a rudimentary OWL ontology model that can be enhanced by ontology modelers. The paper provides examples to demonstrate how the translation is conducted.
Keywords :
data integrity; information retrieval; knowledge representation languages; meta data; object-oriented databases; ontologies (artificial intelligence); relational databases; DBMS; OWL model; database management system; heuristic database modeling technique; information extraction; integrity constraint; object-relational database model; ontology model; relational database model; Computer errors; Computer science; Costs; Data analysis; Data mining; Data models; OWL; Object oriented modeling; Ontologies; Relational databases; Data Models; OWL; Object-Relational Database; Ontology; Relational Database; Reverse-Engineering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Reuse & Integration, 2009. IRI '09. IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-4114-3
Electronic_ISBN :
978-1-4244-4116-7
Type :
conf
DOI :
10.1109/IRI.2009.5211575
Filename :
5211575
Link To Document :
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