• DocumentCode
    3079319
  • Title

    Distributed hardware matcher framework for SoC survivability

  • Author

    Wagner, Ilya ; Lu, Shih-Lien

  • Author_Institution
    Platform Validation Eng., Intel Corp., Santa Clara, CA, USA
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Modern systems on chip (SoCs) are rapidly becoming complex high-performance computational devices, featuring multiple general purpose processor cores and a variety of functional IP blocks, communicating with each other through on-die fabric. While modular SoC design provides power savings and simplifies the development process, it also leaves significant room for a special type of hardware bugs, interaction errors, to slip through pre- and post-silicon verification. Consequently, hard to fix silicon escapes may be discovered late in production schedule or even after a market release, potentially causing costly delays or recalls. In this work we propose a unified error detection and recovery framework that incorporates programmable features into the on-die fabric of an SoC, so triggers of escaped interaction bugs can be detected at runtime. Furthermore, upon detection, our solution locks the interface of an IP for a programmed time period, thus altering interactions between accesses and bypassing the bug in a manner transparent to software. For classes of errors that cannot be circumvented by this in-hardware technique our framework is programmed to propagate the error detection to the software layer. Our experiments demonstrate that the proposed framework is capable of detecting a range of interaction errors with less than 0.01% performance penalty and 0.45% area overhead.
  • Keywords
    reliability; system-on-chip; SoC survivability; distributed hardware matcher framework; functional IP blocks; general purpose processor cores; on-die fabric; systems on chip; Computer bugs; Detectors; Fabrics; Hardware; IP networks; Software; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763054
  • Filename
    5763054