DocumentCode :
3079351
Title :
Image quality assessment metrics based on multi-scale edge presentation
Author :
Zhai, Guangtao ; Zhang, Wenjun ; Yang, Xiaokang ; Xu, Yi
Author_Institution :
Inst. of Image Commun. & Inf. Process., Shanghai Jiao Tong Univ., China
fYear :
2005
fDate :
2-4 Nov. 2005
Firstpage :
331
Lastpage :
336
Abstract :
We propose two image quality assessment metrics named multi-scale modular similarity (M2S) and multi-scale modular maxima similarity (M3S). It has been well known 1) multi-scale analysis is an effective decomposition technique in image processing, and 2) contours and edges analyses are crucial in the understanding of natural scenes. Motivated by these two facts, we attempt to develop quality assessment metrics using multi-scale edges presentation. We decompose an image with un-decimated dyadic wavelet transform, and then develop M2S metric to evaluate the quality of images by comparing the modulus across scales of wavelet transform. Multi-scale edges are defined as local maxima of modulus, which often contain the most important information of the image. As a further step of M2S metric, M3S only uses the multi-scale edge information. M3S is therefore essentially a reduced-reference image quality metric. Extensive experiments indicate that in most cases, the prediction abilities of these two proposed metrics are similarly excellent and both outperform the widely used PSNR and the simple structural similarity metrics.
Keywords :
feature extraction; image processing; wavelet transforms; edges analyses; image processing; image quality assessment metrics; multiscale edge information; multiscale edge presentation; multiscale modular maxima similarity; multiscale modular similarity; undecimated dyadic wavelet transform; Humans; Image analysis; Image communication; Image processing; Image quality; Layout; PSNR; Psychology; Wavelet coefficients; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing Systems Design and Implementation, 2005. IEEE Workshop on
ISSN :
1520-6130
Print_ISBN :
0-7803-9333-3
Type :
conf
DOI :
10.1109/SIPS.2005.1579888
Filename :
1579888
Link To Document :
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