• DocumentCode
    3079358
  • Title

    Insights into testing and validation of DC offset removal filters in numerical distance protection

  • Author

    Venkatesh, C. ; Swarup, K. Shanti

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India
  • fYear
    2012
  • fDate
    7-9 Dec. 2012
  • Abstract
    Distance relay maloperates due to various reasons, like dc offset in current waveforms, capacitive voltage transformer transients, remote-end in-feed in the presence of fault resistance, power swings and loading. dc offset in current waveforms results in overreach, causing distance relay to operate for faults outside its protected zone. There are many offset removal filters proposed by researchers in literature, but it is found, that the same ideas fail to penetrate as a filter into today´s Intelligent Electronic Devices (IED). The objective of this paper is not to propose a new filter, but to provide insights into testing and validating those DC offset removal filters, which are not focused till now. This paper provides the additional factor to be considered for validating filters, which are proposed for dc offset removal and this is done by comparing the performance of three dc offset removal filters, digital mimic filter (dmf), patented filter (pf) to remove dc offset and double differentiator filter (ddf) which are currently used by relay manufacturers.
  • Keywords
    circuit testing; digital filters; numerical analysis; potential transformers; relays; DC offset removal filter; DDF; DMF; IED; PF; capacitive voltage transformer transient; current waveform; digital mimic filter; distance relay maloperation; double differentiator filter; fault resistance; intelligent electronic device; numerical distance protection; patented filter; power loading; power swing; remote-end in-feed; Current transformers; Equations; Gain; Impedance; MIMICs; Relays; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    India Conference (INDICON), 2012 Annual IEEE
  • Conference_Location
    Kochi
  • Print_ISBN
    978-1-4673-2270-6
  • Type

    conf

  • DOI
    10.1109/INDCON.2012.6420592
  • Filename
    6420592