Bridging test languages to reuse test information: A metamodel for test information

The lack of test information reuse among different life cycle phases of system results in significant overhead costs to system test. Thus, a common model is needed to bridge and reuse the existing test information between different test phases. In this paper, a metamodel for test information reuse, test exchange metamodel (TEMM), was proposed. As a common model, it covers the possibly widest spectrum of different test languages for test information descriptions. With appropriate transforming adapters and rules, different test information can be transformed into TEMM models, and meanwhile TEMM models can be transformed into different individual test information.