Testing of high-speed DACs using PRBS generation with “Alternate-Bit-Tapping”

Testing of high-speed Digital-to-Analog Converters (DACs) is a challenging task, as it requires large number of high-speed synchronized input signals with specific test patterns. To overcome this problem, we propose use of PRBS signals with an “Alternate-Bit-Tapping” technique and eye-diagram measurement as a solution to efficiently generate the test-vectors and test the DACs. This approach covers all levels and transitions necessary for testing the dynamic behavior of the DAC completely, in minimum possible time. Circuit level simulations are used to verify its usefulness in testing a 4-bit 20-GS/s current-steering DAC.