DocumentCode
3079766
Title
Power-driven global routing for multi-supply voltage domains
Author
Wu, Tai-Hsuan ; Davoodi, Azadeh ; Linderoth, Jeffrey T.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin at Madison, Madison, WI, USA
fYear
2011
fDate
14-18 March 2011
Firstpage
1
Lastpage
6
Abstract
This work presents a method for global routing (GR) to minimize interconnect power. We consider design with multi-supply voltage, where level converters are added to nets that connect driver cells to sink cells of higher supply voltage. The level converters are modeled as additional terminals during GR. Given an initial GR solution obtained with the objective of minimizing wirelength, we propose a GR method to detour nets to further save the interconnect power. When detouring routes via this procedure, overflow is not increased, and the increase in wirelength is bounded. The power saving opportunities include: 1) reducing the area capacitance of the routes by detouring from the higher metal layers to the lower ones, 2) reducing the coupling capacitance between adjacent routes by distributing the congestion, and 3) considering different power-weights for each segment of a routed net with level converters (to capture its corresponding supply voltage and activity factor). We present a mathematical formulation to capture these power saving opportunities and solve it using integer programming techniques. In our simulations, we show considerable saving in an interconnect power metric for GR, without any wirelength degradation.
Keywords
capacitance; integer programming; power convertors; area capacitance reduction; coupling capacitance reduction; integer programming technique; interconnect power metric; interconnect power minimisation; level converter; mathematical formulation; multisupply voltage domain; power saving opportunity; power-driven global routing; wirelength minimisation; Capacitance; Converters; Neodymium; Pricing; Routing; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location
Grenoble
ISSN
1530-1591
Print_ISBN
978-1-61284-208-0
Type
conf
DOI
10.1109/DATE.2011.5763077
Filename
5763077
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