• DocumentCode
    3079867
  • Title

    Dynamic write limited minimum operating voltage for nanoscale SRAMs

  • Author

    Nalam, Satyanand ; Chandra, Vikas ; Aitken, Robert C. ; Calhoun, Benton H.

  • Author_Institution
    Dept. of ECE, Univ. of Virginia, Charlottesville, VA, USA
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Dynamic stability analysis for SRAM has been growing in importance with technology scaling. This paper analyzes dynamic writability for designing low voltage SRAM in nanoscale technologies. We propose a definition for dynamic write limited VMIN. To the best of our knowledge, this is the first definition of a VMIN based on dynamic stability. We show how this VMIN is affected by the array capacity, the voltage scaling of the word-line pulse, the bitcell parasitics, and the number of cycles prior to the first read access. We observe that the array can be either dynamically or statically write limited depending on the aforementioned factors. Finally, we look at how voltage-bias based write assist techniques affect the dynamic write limited VMIN.
  • Keywords
    SRAM chips; dynamic stability analysis; dynamic writability analysis; dynamic write limited minimum operating voltage; nanoscale SRAM; word-line pulse; Arrays; Capacitance; Measurement; Power system dynamics; Power system stability; Random access memory; Stability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763081
  • Filename
    5763081