DocumentCode
3079867
Title
Dynamic write limited minimum operating voltage for nanoscale SRAMs
Author
Nalam, Satyanand ; Chandra, Vikas ; Aitken, Robert C. ; Calhoun, Benton H.
Author_Institution
Dept. of ECE, Univ. of Virginia, Charlottesville, VA, USA
fYear
2011
fDate
14-18 March 2011
Firstpage
1
Lastpage
6
Abstract
Dynamic stability analysis for SRAM has been growing in importance with technology scaling. This paper analyzes dynamic writability for designing low voltage SRAM in nanoscale technologies. We propose a definition for dynamic write limited VMIN. To the best of our knowledge, this is the first definition of a VMIN based on dynamic stability. We show how this VMIN is affected by the array capacity, the voltage scaling of the word-line pulse, the bitcell parasitics, and the number of cycles prior to the first read access. We observe that the array can be either dynamically or statically write limited depending on the aforementioned factors. Finally, we look at how voltage-bias based write assist techniques affect the dynamic write limited VMIN.
Keywords
SRAM chips; dynamic stability analysis; dynamic writability analysis; dynamic write limited minimum operating voltage; nanoscale SRAM; word-line pulse; Arrays; Capacitance; Measurement; Power system dynamics; Power system stability; Random access memory; Stability analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location
Grenoble
ISSN
1530-1591
Print_ISBN
978-1-61284-208-0
Type
conf
DOI
10.1109/DATE.2011.5763081
Filename
5763081
Link To Document