• DocumentCode
    3079945
  • Title

    Developing an integrated verification and debug methodology

  • Author

    Matsuda, Akitoshi ; Ishihara, Tohru

  • Author_Institution
    Dept. of Automotive Sci., Kyushu Univ., Fukuoka, Japan
  • fYear
    2011
  • fDate
    14-18 March 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    As design complexity of LSI systems increase, so does the verification challenges. It is very important, yet difficult to find all design errors and correct them in a timely manner. This paper presents our experience with a new verification and debug methodology based on the combination of formal verification and automated debugging. This methodology, which is applied to the development of a DDR2 memory design targeted for an FGPA, is found to significantly reduce the verification and debug tasks typically performed.
  • Keywords
    formal verification; large scale integration; program debugging; DDR2 memory design; FGPA; LSI systems; automated debugging; debug methodology; design complexity; formal verification; integrated verification; Analytical models; Computer bugs; Debugging; Field programmable gate arrays; Formal verification; Manuals; Radiation detectors; debug; methodology; system LSI; verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
  • Conference_Location
    Grenoble
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-61284-208-0
  • Type

    conf

  • DOI
    10.1109/DATE.2011.5763087
  • Filename
    5763087