DocumentCode :
3080116
Title :
Three-dimensional simulation of helix traveling-wave tube cold-test characteristics using MAFIA
Author :
Kory, Carol L.
Author_Institution :
NASA Lewis Res. Center, Cleveland, OH, USA
fYear :
1996
fDate :
3-5 June 1996
Firstpage :
234
Abstract :
Summary form only given. A critically important step in the traveling-wave tube (TWT) design process is the cold-testing of the slow-wave circuit for dispersion, beam interaction impedance and RF losses. Experimental cold-tests can be very time-consuming and expensive, thus limiting the freedom to examine numerous variations to the test circuit. This makes the need for computational methods crucial as they can lower cost, reduce tube development time and allow the freedom to introduce novel and improved designs. The cold-test parameters have been calculated for a C-Band Northrop-Grumman helix TWT slow-wave circuit using MAFIA, the three-dimensional electromagnetic finite-integration computer code. The helix model includes tape thickness, rectangular dielectric supports and material properties consistent with the actual circuit.
Keywords :
travelling wave tubes; C-band TWT; MAFIA; Northrop-Grumman helix TWT slow-wave circuit; RF losses; beam interaction impedance; cold-test characteristics; cold-test parameters; cold-testing; computational methods; design process; dispersion; helix model; helix traveling-wave tube; rectangular dielectric supports; slow-wave circuit; tape thickness; three-dimensional electromagnetic finite-integration computer code; three-dimensional simulation; tube development time; Attenuation; Bandwidth; Circuit simulation; Circuit testing; Computational modeling; Costs; Dielectrics; Impedance; Process design; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
Conference_Location :
Boston, MA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3322-5
Type :
conf
DOI :
10.1109/PLASMA.1996.551447
Filename :
551447
Link To Document :
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