Title :
Measurement of optical nonlinear response in silicon wire waveguides by frequency-resolved optical gating
Author :
Suda, S. ; Tanizawa, K. ; Kawashima, H. ; Namiki, S. ; Hasama, T. ; Ishikawa, H.
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
Abstract :
We measured SPM-induced phase shift in the silicon wire waveguide at a carrier-steady state by frequency-resolved optical gating at a repetition rate of 10 GHz, and designed all-optical switch based on Mach-Zehnder interferometer.
Keywords :
Mach-Zehnder interferometers; elemental semiconductors; optical switches; optical variables measurement; optical waveguides; self-phase modulation; silicon; Mach-Zehnder interferometer; SPM-induced phase shift; Si; all-optical switch; carrier-steady state; frequency 10 GHz; frequency-resolved optical gating; optical nonlinear response measurement; self-phase modulation; silicon wire waveguides; Nonlinear optics; Optical pulses; Optical signal processing; Optical waveguides; Silicon; Ultrafast optics; Wires;
Conference_Titel :
Opto-Electronics and Communications Conference (OECC), 2012 17th
Conference_Location :
Busan
Print_ISBN :
978-1-4673-0976-9
Electronic_ISBN :
2166-8884
DOI :
10.1109/OECC.2012.6276668
