DocumentCode :
3080349
Title :
Multi-resolution approach to strain imaging
Author :
Dey, Joyoni ; Mai, Jerome J. ; Insana, Michael F.
Author_Institution :
Biomed. Eng., California Univ., Davis, CA, USA
Volume :
2
fYear :
2000
fDate :
36800
Firstpage :
1853
Abstract :
An essential goal of a strain imaging experiment is to balance the desire to apply large deformations, and thereby maximize contrast, with the need to maintain waveform coherence between echoes recorded before and after deformation, and thereby minimize decorrelation noise. The tools available to achieve an optimal balance include control of boundary conditions and application of reconstruction algorithms that use all the available waveform information. This paper describes our work with a multi-resolution strain algorithm employing the maximum-likelihood strategy of filtering and waveform warping at several spatial scales. We found that echo waveform filtering improves the strain CNR when the echo SNR>30 dB and the applied strain >5%. We found that envelope-detected echoes provide more robust estimates than low-pass filtered RF echoes under most practical conditions. The benefits of echo-signal filtering for minimizing decorrelation noise are modest
Keywords :
acoustic correlation; biological tissues; biomechanics; biomedical ultrasonics; decorrelation; elasticity; filtering theory; image resolution; maximum likelihood estimation; medical image processing; strain measurement; Rayleigh scattering object; coherence functions; decorrelation noise minimisation; echo waveform filtering; elasticity imaging; envelope-detected echoes; maximum-likelihood strategy; multiresolution strain algorithm; reconstruction algorithms; robust estimates; strain CNR; strain imaging; waveform warping; Boundary conditions; Capacitive sensors; Coherence; Decorrelation; Filtering algorithms; Low pass filters; Maximum likelihood estimation; Noise robustness; Optimal control; Reconstruction algorithms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2000 IEEE
Conference_Location :
San Juan
ISSN :
1051-0117
Print_ISBN :
0-7803-6365-5
Type :
conf
DOI :
10.1109/ULTSYM.2000.921685
Filename :
921685
Link To Document :
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