• DocumentCode
    3080401
  • Title

    Novel Multi-bit Bitwise Adaptive Embedding Algorithms with Minimum Error for Data Hiding

  • Author

    Chen, Rong-Jian ; Peng, Yu-Cheng ; Lin, Jun-Jian ; Lai, Jui-Lin ; Horng, Shi-Jinn

  • Author_Institution
    Dept. of Electron. Eng., Nat. United Univ., Miaoli, Taiwan
  • fYear
    2010
  • fDate
    1-3 Sept. 2010
  • Firstpage
    306
  • Lastpage
    311
  • Abstract
    This paper presents the novel multi-bit bitwise adaptive embedding algorithms for data hiding. These embedding algorithms can embed multi-bit (k-bit, k ≥ 1 ) secret data into cover data only introduce minimum embedding error smaller than (2k-1-1)2i-k according to the embedding location i. To achieve such a goal, the proposed embedding algorithm adaptively evaluates the most similar value to replace the original one and which can be divided into three steps: (1) embed logo data into cover data, (2) adaptively adjust the least-significant bits (LSBs) of cover data, and (3) adaptively adjust the maximum-significant bits (MSBs) of cover data. The proposed embedding algorithms are not only achieving minimum error but also suitable to hardware implementation due to it is based on logic, algebraic, and bit operations. Many simulations show that the proposed embedding algorithms perform good embedding quality for watermarking and steganography applications.
  • Keywords
    embedded systems; error statistics; steganography; watermarking; data hiding; least-significant bits; maximum-significant bits; minimum error; novel multibit bitwise adaptive embedding algorithms; secret data; steganography applications; watermarking application; Discrete wavelet transforms; Frequency domain analysis; Image color analysis; PSNR; Robustness; Simulation; Watermarking; data hiding; steganography; watermarking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Network and System Security (NSS), 2010 4th International Conference on
  • Conference_Location
    Melbourne, VIC
  • Print_ISBN
    978-1-4244-8484-3
  • Electronic_ISBN
    978-0-7695-4159-4
  • Type

    conf

  • DOI
    10.1109/NSS.2010.57
  • Filename
    5635509