DocumentCode
3080841
Title
A novel shape analysis technique for somatosensory evoked potentials
Author
Agrawal, Gracee ; Sherman, David ; Thakor, Nitish ; All, Angelo
Author_Institution
Department of Biomedical Engineering, Johns Hopkins University, Baltimore, MD 21210 USA
fYear
2008
fDate
20-25 Aug. 2008
Firstpage
4688
Lastpage
4691
Abstract
Somatosensory evoked potentials (SEP) have been shown to be an important electrophysiological measure to assess the integrity of the spinal cord. However the peaks in the SEP waveform are often undetectable due to low signal-to-noise (SNR) ratio. Sometimes they also become indistinct during injury when the SEP flattens. Hence time-domain analysis methods are often subject to errors, and need human-expert intervention. In this paper, we propose a new technique for analyzing the shape of the evoked potentials, in which slope information is obtained for the entire signal in specific time bins. Apart from solving the problems associated with present methods, this technique has an added advantage of analyzing the SEP signal as a whole rather than simply a few peaks. The efficacy of this technique was investigated on SEP signals recorded from 12 rats before and after contusion spinal cord injury at thoracic vertebra T8. The statistical analysis results revealed significant effect of injury to hindlimbs, whereas almost none to forelimbs. Thus, the results show high potential of this technique to differentiate between normal and injured spinal cord.
Keywords
Biomedical engineering; Biomedical measurements; Electrodes; Frequency domain analysis; Information analysis; Injuries; Morphology; Shape; Surgery; Time domain analysis; Algorithms; Animals; Automatic Data Processing; Evoked Potentials, Somatosensory; Female; Models, Statistical; Pattern Recognition, Automated; Rats; Rats, Inbred F344; Reproducibility of Results; Spinal Cord; Spinal Cord Compression; Synaptic Potentials; Time Factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
Conference_Location
Vancouver, BC
ISSN
1557-170X
Print_ISBN
978-1-4244-1814-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2008.4650259
Filename
4650259
Link To Document