DocumentCode :
3080916
Title :
Energy parsimonious circuit design through probabilistic pruning
Author :
Lingamneni, Avinash ; Enz, Christian ; Nagel, Jean-Luc ; Palem, Krishna ; Piguet, Christian
Author_Institution :
Centre Suisse d´´Electron. et de Microtech. (CSEM) SA, Neuchatel, Switzerland
fYear :
2011
fDate :
14-18 March 2011
Firstpage :
1
Lastpage :
6
Abstract :
Inexact Circuits or circuits in which the accuracy of the output can be traded for energy or delay savings, have been receiving increasing attention of late due to invariable inaccuracies in designs as Moore´s law approaches the low nanometer range, and a concomitant growing desire for ultra low energy systems. In this paper, we present a novel design-level technique called probabilistic pruning to realize inexact circuits. Unlike the previous techniques in literature which relied mostly on some form of scaling of operational parameters such as the supply voltage (Vdd) to achieve energy and accuracy tradeoffs, our technique uses pruning of portions of circuits having a lower probability of being active, as the basis for performing architectural modifications resulting in significant savings in energy, delay and area. Our approach yields more savings when compared to any of the conventional voltage scaling schemes, for similar error values. Extensive simulations using this pruning technique in a novel logic synthesis based CAD framework on various architectures of 64-bit adders demonstrate that normalized gains as great as 2X-7.5X in the Energy-Delay-Area product can be obtained, with a relative error percentage as low as 10-6% up to 10%, when compared to corresponding conventionally correct designs.
Keywords :
adders; logic CAD; probability; CAD framework; Moore law; adders; design-level technique; energy parsimonious circuit design; energy-delay-area product; inexact circuit; logic synthesis; low nanometer range; probabilistic pruning; supply voltage; ultralow energy system; Accuracy; Adders; Delay; Design automation; Gain; Integrated circuit modeling; Probabilistic logic;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011
Conference_Location :
Grenoble
ISSN :
1530-1591
Print_ISBN :
978-1-61284-208-0
Type :
conf
DOI :
10.1109/DATE.2011.5763130
Filename :
5763130
Link To Document :
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