• DocumentCode
    3081009
  • Title

    Fabrication at wafer level of micromachined gas sensors based on Sno2 nanorods deposited by PECVD and gas sensing characteristics

  • Author

    Forleo, A. ; Francioso, L. ; Capone, S. ; Casino, F. ; Siciliano, P. ; Huang, H. ; Tan, O.K.

  • Author_Institution
    Ist. per la Microelettronica ed i Microsistemi, Consiglio Naz. delle Ric., Lecce, Italy
  • fYear
    2011
  • fDate
    28-29 June 2011
  • Firstpage
    196
  • Lastpage
    198
  • Abstract
    SnO2 nanorods were successfully deposited on 3" Si/SiO2 wafers by inductively coupled plasma-enhanced chemical vapor deposition (PECVD) and a wafer-level patterning of nanorods layer for miniaturized solid state gas sensor fabrication were performed. Uniform needle-shape SnO2 nanorods in situ grown were obtained under catalyst- and high temperature treatment-free growth condition. These nanorods have an average diameter between 5 and 15 nm and a length of 160 to 300 nm. The SnO2-nanords based gas sensors were tested towards NH3 and CH3OH and gas sensing tests show remarkable response, showing promising and repeatable results compared with the SnO2 thin films gas sensors.
  • Keywords
    chemical vapour deposition; gas sensors; microsensors; nanorods; silicon compounds; thin film sensors; wafer level packaging; PECVD; Si-SiO2; micromachined gas sensors; miniaturized solid state gas sensor fabrication; nanorod deposition; plasma-enhanced chemical vapor deposition; size 160 nm to 300 nm; thin films gas sensors; wafer-level patterning; Chemical sensors; Chemicals; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Sensors and Interfaces (IWASI), 2011 4th IEEE International Workshop on
  • Conference_Location
    Savelletri di Fasano
  • Print_ISBN
    978-1-4577-0623-3
  • Electronic_ISBN
    978-1-4577-0622-6
  • Type

    conf

  • DOI
    10.1109/IWASI.2011.6004716
  • Filename
    6004716