مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3081778

Title :

Two-layer Reflectance Models

Author :

Hapke, Bruce

Author_Institution :

University of Pittsburgh

fYear :

1990

fDate :

20-24 May 1990

Firstpage :

1733

Lastpage :

1734

Keywords :

Artificial intelligence; Bidirectional control; Equations; Light scattering; Optical scattering; Optical sensors; Particle scattering; Reflectivity; Snow; Soil;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Geoscience and Remote Sensing Symposium, 1990. IGARSS '90. 'Remote Sensing Science for the Nineties'., 10th Annual International

Type :

conf

DOI :

10.1109/IGARSS.1990.688849

Filename :

688849

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3081778