Title :
Electrical characterization of GaN based blue light emitting diodes
Author :
Awaah, M.A. ; Nana, R. ; Das, K.
Author_Institution :
Dept. of Electr. Eng., Tuskegee Univ., AL, USA
Abstract :
Blue light emitting diodes (LEDs), based on an AlGaN/GaN/AlGaN double heterojunction structure, have been electrically characterized. These diodes are highly non-ideal with several approximately linear regimes in the semi-logarithmic plots of the forward characteristics. Calculated values of the ideality factor range from 3.0-7.0, indicating that the recombination process in these diodes cannot be conveniently described by the Shockley-Read-Hall statistics. Logarithmic plots of the forward characteristics indicate a space-charge-limited-current (SCLC) conduction through the active region of the diodes. Observed changes in the slope of these logarithmic plots are representative of a high density of "deep-level states" in the active region of the diodes. An analysis of these characteristics yielded an approximate density of deep-level states of 2×1017/cm3. These states are most likely located close to the valence band edge, in the compensated active region of the diodes.
Keywords :
III-V semiconductors; aluminium compounds; deep levels; electron-hole recombination; gallium compounds; light emitting diodes; semiconductor device measurement; space charge; valence bands; wide band gap semiconductors; AlGaN-GaN; LED characterization; SCLC conduction; blue light emitting diodes; characteristics approximately linear regimes; compensated active region; deep-level states high density; double heterojunction structure; forward characteristics semi-logarithmic plots; ideality factor; recombination process; space-charge-limited-current; valence band edge; Aluminum gallium nitride; Crystallization; Gallium nitride; III-V semiconductor materials; Light emitting diodes; Optical films; Photonic band gap; Substrates; Thermal conductivity; Thermal stresses;
Conference_Titel :
SoutheastCon, 2005. Proceedings. IEEE
Print_ISBN :
0-7803-8865-8
DOI :
10.1109/SECON.2005.1423209