Designs of analog and digital comparators with FGMOS

Author

Nandhasri, K. ; Ngarmnil, J.

Author_Institution

Dept. of Electron. Eng., Mahanakorn Univ. of Technol., Bangkok, Thailand

Volume

1

fYear

2001

fDate

6-9 May 2001

Firstpage

25

Abstract

Designs of analog and digital comparators are presented in this paper. We exploit the threshold voltage operation characteristic of floating-gate MOSFETs to produce a hysteresis-tunable analog voltage comparator. Consequently, the proposed analog comparator circuit is developed to a digital comparator using replacement of floating-gate MOSFETs for the input devices of which the drain currents are linear sums of the weighted multiple-input voltages which are then applied as binary bits. Simulation results on 1.2 μm CMOS are demonstrated

Keywords

CMOS analogue integrated circuits; CMOS digital integrated circuits; circuit feedback; circuit simulation; comparators (circuits); 1.2 micron; CMOS; FGMOS; binary bits; digital comparator; drain currents; floating-gate MOSFETs; hysteresis-tunable analog voltage comparator; threshold voltage operation characteristic; weighted multiple-input voltages; Analog circuits; Circuit simulation; Design engineering; Equations; Feedback; Hysteresis; MOSFETs; Threshold voltage; Tunable circuits and devices; Virtual manufacturing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on

Conference_Location

Sydney, NSW

Print_ISBN

0-7803-6685-9

Type

conf

DOI

10.1109/ISCAS.2001.921779

Filename

921779